Reflectance Targets

Thanks to their large material thickness of 10 mm, Spectralex reflection targets (diffuse reflecting reference measuring surfaces) offer the highest possible levels of diffuse reflection over a wide wavelength range (250-2500nm). Their constant and almost perfectly Lambertian reflection behaviour therefore makes these reflection targets the ideal reference measuring surface for the calibration or white balancing of optical devices where a large reference surface is required.

Spectralex reflection targets are particular well-suited for use in space and vacuum applications, as only pure optical PTFE can be used in these cases. As a high-purity volume reflector, our material is therefore used in a wide range of different areas of application.

Another advantage offered by this material is the possibility of cleaning the measuring surface. In order to remove the contaminated top material layer without impacting upon the material’s unique reflection properties (~99%) as a volume reflector, a particular minimum thickness is required (min. 8mm).

The unique material properties offered by Spectralex also ensure protection against discolouration and embrittlement of the measuring surface even under harsh environmental conditions. This guarantees long-term use without any loss of reflection and with maximum dimensional stability.

Our Spectralex reflection targets are available in different reflection levels and dimensions. It is also possible to have multiple reflection levels within a single reflection target. We will also be happy to help develop customer-specific solutions just for you – just get in touch!

Lake Photonics has a calibration laboratory for measuring the diffuse reflection of flat surfaces (spectral radiance factor ß(8°/d)).

The measurements are taken using a UV-Vis-NIR spectrophotometer (Lambda 950S) by PerkinElmer®. The spectral range of the measurements is between 250 and 2450nm. The measurement data is traceable to the National Metrology Institute of Germany (PTB), and is provided electronically in measuring steps of 1nm. A certificate with printed measured values in 50nm steps is also provided.